The event also features an optional pre-conference workshop on the basic principles of particle characterization.
Additional speakers have been added to the roster for the upcoming Particle Summit, which takes place Oct. 20-21, 2010, at The Charles Hotel, Cambridge, Mass.
Dr. Joerg Bolze from analytical X-ray company PANalytical will discuss Nanoparticle size distribution determination by small-angle X-ray scattering on a multi-purpose X-ray diffractometer platform. He will include a short introduction to the SAXS technique together with application examples illustrating its potential and limitations for liquid nano-particle dispersions, nano-powders, and nano-composites.
Alon Vaisman from Malvern Instruments will present Particle sizing -- a proven technology for process control, in which he will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.
The event, which is sponsored by Malvern Instruments, also features an optional pre-conference workshop on October 19 where participants can learn or refresh their knowledge of the basic principles of particle characterization.
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